X-ray and Structural Analysis

X-Ray Diffractometer with high resolution (the SmartLab) makes a completely automated analysis of thin films and other advanced materials.

Detailed information:
Mr. Edmunds Tamanis
Centre of Innovative Microscopy
1 Parādes Street,
Daugavpils, LV-5401
E-mail: edmunds.tamanis[at]du.ces.lv

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